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Volumn 71, Issue 24, 1997, Pages 3525-3527
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Strain induced interface roughness of Si1 - XCx δ layers on Si(001)
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0005298873
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.120380 Document Type: Article |
Times cited : (6)
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References (15)
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