Microscopic analysis of the influence of strain and band-gap offsets on noise characteristics in Si1-xGex/Si heterojunctions

Journal of Applied Physics

Volumn 84, Issue 9, 1998, Pages 5012-5020

  Martinez, M J Martín ^a   Pardo, D ^a   Velazquez J E ^a  

^a UNIVERSITY OF SALAMANCA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0004793274     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368748     Document Type: Article

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