Operational experience with a valved antimony cracker source for use in molecular beam epitaxy

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 16, Issue 5, 1998, Pages 2660-2664

  Hall, E ^a   Naone, R ^a   English, J E ^a   Blank, H R ^a   Champlain, J ^a   Kroemer, H ^a  

^a University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0004719196     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.590252     Document Type: Article

References (12)

1. H. K. Choi, G. W. Turner, and Z. L. Liau, Appl. Phys. Lett. 65, 2251 (1994).
2. A. A. Allerman, R. M. Biefeld, and S. R. Kurtz, Appl. Phys. Lett. 69, 465 (1996).
3. K. Xie, J. H. Zhao, Y. Shi, H. Lee, and G. Olsen, IEEE Photonics Technol. Lett. 8, 667 (1996).
4. C. R. Bolognesi, E. J. Caine, and H. Kroemer, IEEE Electron Device Lett. 15, 16 (1994).
5. B. Brar and H. Kroemer, IEEE Electron Device Lett. 16, 548 (1995).
6. P. D. Brewer, D. H. Chow, and R. H. Miles, J. Vac. Sci. Technol. B 14, 2335 (1996).
7. Y. Rouillard, B. Lambert, Y. Toudic, M. Baudet, and M. Gauneau, J. Cryst. Growth 156, 30 (1995).
8. B. Brar and D. Leonard, Appl. Phys. Lett. 66, 463 (1995).
9. H.-R. Blank, M. Thomas, K. C. Wong, and H. Kroemer, Appl. Phys. Lett. 69, 2080 (1996).
10. Y.-H. Zhang and D. H. Chow, Appl. Phys. Lett. 65, 3239 (1994).
11. S. Nemeth, B. Grietens, and G. Borghs, J. Appl. Phys. 77, 3552 (1995).
12. H.-R. Blank, S. Mathis, E. Hall, S. Bhargava, A. Behres, M. Heuken, H. Kroemer, and V. Narayanamurti, J. Cryst. Growth 187, 18 (1997).