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Volumn 75, Issue 20, 1999, Pages 3219-3221

Direct observation of electron emission site on boron-doped polycrystalline diamond thin films using an ultra-high-vacuum scanning tunneling microscope

(6) Kim, Y D a Choi, W a Wakimoto, H b Usami, S b Tomokage, H b Ando, T c

a Fukuoka Indust Sci Technol F (Japan)

b FUKUOKA UNIVERSITY (Japan)

c NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000973122 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.125283 Document Type: Article

Times cited : (47)

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