Dependence of gate control on the aspect ratio in metal/metal-oxide/metal tunnel transistors

Journal of Applied Physics

Volumn 84, Issue 2, 1998, Pages 1133-1139

  Buot, F A ^a   Rendell, R W ^a   Snow, E S ^a   Campbell, P M ^a   Park, D ^a   Marrian, C R K ^a   Magno, R ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0003688632     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368114     Document Type: Article

References (17)

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