DUV scattering measurements as a tool for characterization of UV-optical surfaces

Applied Physics A: Materials Science and Processing

Volumn 72, Issue 1, 2001, Pages 59-65

  Apel, O ^a   Mann, K ^a  

^a LASER LABORATORIUM GÖTTINGEN E V   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0003165814     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390000600     Document Type: Article

References (15)

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