SEM and AES depth profile studies of thin titanium and titanium oxide films covered by nanoscale evaporated Au layers

Fresenius' Journal of Analytical Chemistry

Volumn 365, Issue 1-3, 1999, Pages 231-235

  Van Den Berg, A H J ^a   Lisowski, W ^b   Smithers, M ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

^b INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042442921     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s002160051479     Document Type: Article

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