X-ray photoelectron spectroscopy sputter profile study of the native air-formed oxide film on titanium

Applied Surface Science

Volumn 143, Issue 1, 1999, Pages 92-100

  McCafferty, E ^a   Wightman, J P ^a  

^a VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; FILMS; ION BOMBARDMENT; OXIDES; SPUTTERING; TITANIUM; TITANIUM DIOXIDE;

DEPTH PROFILE; OXIDE FILM;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0032664453     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00927-1     Document Type: Article

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