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This article provides an excellent review of the use of RHEED for in situ analysis of oxide surfaces during growth. Most of the article deals with the growth analysis of Bi-Sr-Ca-Cu-O films by atomic layer-by-layer MBE carried out in the authors' laboratory. of special interest
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This article provides an excellent review of the use of RHEED for in situ analysis of oxide surfaces during growth. Most of the article deals with the growth analysis of Bi-Sr-Ca-Cu-O films by atomic layer-by-layer MBE carried out in the authors' laboratory. Bozovic I, Eckstein JN. Analysis of growing films of complex oxides by RHEED. MRS Bull. 1995;32-38. of special interest.
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This paper provides a detailed structural analysis using high-resolution X-ray diffraction and X-ray reflectivity of infinite layer superlattice films prepared by PLD. The analysis shows that superlattice films can be grown with structural roughness less than 3-4 Å. The strain and Poisson ratio of the layers have also been estimated from the measurements. of special interest
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This paper provides a detailed structural analysis using high-resolution X-ray diffraction and X-ray reflectivity of infinite layer superlattice films prepared by PLD. The analysis shows that superlattice films can be grown with structural roughness less than 3-4 Å. The strain and Poisson ratio of the layers have also been estimated from the measurements. Del Vecchio A, Tapfer L, Aruta C, Balestrino G, Petrocelli G. Structural analysis of infinite-layer superlattices grown by pulsed laser deposition. J Appl Phys. 80:1996;781-786. of special interest.
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12 superlattices prepared with PLD. The authors have demonstrated the use of grazing angle X-ray reflectivity for precise calibration and thereby the ability to control the thickness of individual layers. of special interest
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12 superlattices. Appl Phys Lett. 69:1996;854-856. of special interest.
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