New family of copper-oxide-based isotropic metallic oxides for normal metal barriers in SNS junctions

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2697, Issue , 1996, Pages 202-210

  Eom, Chang Beom ^a  

^a Duke University   (United States)

Author keywords

High Tc superconductors; Metallic oxides; SNS junctions; Sputtering; Thin films

Indexed keywords

COPPER; COPPER COMPOUNDS; COPPER OXIDES; CRYSTALS; ELECTRIC CONDUCTIVITY; EPITAXIAL FILMS; LANTHANUM; METALLIC SOAPS; METALS; OXIDE FILMS; OXIDE SUPERCONDUCTORS; OXIDES; OXYGEN; PARAMAGNETISM; PEROVSKITE; SOLIDS; SUPERCONDUCTING DEVICES; SUPERCONDUCTING FILMS; SUPERCONDUCTING MATERIALS; SUPERCONDUCTIVITY; THIN FILMS;

BOUNDARY RESISTANCES; CHEMICAL COMPATIBILITIES; CRYSTALLINE QUALITIES; CUBIC PEROVSKITES; CUPRATE SUPERCONDUCTORS; EPITAXIAL THIN FILMS; HETEROSTRUCTURES; HIGH TC SUPERCONDUCTORS; IN-SITU; INTERFACE RESISTANCES; LATTICE MATCHES; METALLIC OXIDES; NORMAL METALS; OXYGEN DEFICIENTS; PAULI PARAMAGNETISMS; SNS JOSEPHSON JUNCTIONS; SNS JUNCTIONS; X-RAY DIFFRACTIONS;

METALLIC COMPOUNDS;

EID: 0040970158     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.250237     Document Type: Conference Paper

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