Formation and properties of novel artificially layered cuprate superconductors using pulsed-laser deposition

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2697, Issue , 1996, Pages 295-305

  Norton, David P ^a   Chakoumakos, B C ^a   Budai, J D ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Artificially layered epitaxy; Infmite layer; Superlattices; Vortex fluctuations

Indexed keywords

BARIUM; CALCIUM; CELL GROWTH; COPPER COMPOUNDS; COPPER OXIDES; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL GROWTH; DIFFRACTION; FILM GROWTH; HOLOGRAPHIC INTERFEROMETRY; LASERS; MATERIALS PROPERTIES; MODULATION; OXIDE SUPERCONDUCTORS; OXYGEN; PENETRATION DEPTH (SUPERCONDUCTIVITY); PULSED LASER APPLICATIONS; PULSED LASER DEPOSITION; SUPERCONDUCTING FILMS; SUPERCONDUCTING MATERIALS; SUPERCONDUCTIVITY; TWO DIMENSIONAL; VORTEX FLOW; X RAY ANALYSIS; X RAY DIFFRACTION;

ARTIFICIALLY-LAYERED EPITAXY; CELL CONTROLS; COULOMB GASSES; CUPRATE COMPOUNDS; CUPRATE SUPERCONDUCTORS; EPITAXIAL STABILIZATIONS; FILM MATERIALS; IN-SITU; INFINITE LAYERS; INFMITE LAYER; LASER DEPOSITIONS; LAYER THICKNESSES; LENGTH SCALES; OXYGEN PRESSURES; RESISTANCE CURVES; SUPERCONDUCTING TRANSITIONS; SUPERLATTICE STRUCTURES; THICKNESS OF THE FILMS; THICKNESS VARIATIONS; TRANSPORT MEASUREMENTS; UNIT CELLS; VORTEX FLUCTUATIONS; X-RAY DIFFRACTIONS;

ELECTRIC CONDUCTIVITY;

EID: 0040375903     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.250248     Document Type: Conference Paper

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