Glass and silicon probes: A comparative theoretical study for near-field optical microscopy

Journal of Applied Physics

Volumn 84, Issue 1, 1998, Pages 52-57

  Castiaux, A ^a   Danzebrink, H U ^b   Bouju, X ^c  

^a UNIVERSITY OF NAMUR   (Belgium)

^b PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^c UNIVERSITÉ DE FRANCHE COMTÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001791473     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368095     Document Type: Review

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