Formation and deterioration mechanisms of low-resistance TaTi ohmic contacts for p-GaN

Journal of Applied Physics

Volumn 86, Issue 9, 1999, Pages 5079-5084

  Suzuki, Masaaki ^a   Arai, T ^a   Kawakami, T ^a   Kobayashi, S ^a   Fujita, S ^a   Koide, Yasuo ^a   Taga, Y ^b   Murakami, Masanori ^a  

^a KYOTO UNIVERSITY   (Japan)

^b Rd Management Section   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001651160     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.371483     Document Type: Article

References (20)

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