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1
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0026960616
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The effects of incoherent scattering on ellipsom-etry
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D. H. Goldstein and R. A. Chipman, eds., Proc. SPIE
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S.-M. F. Nee, “The effects of incoherent scattering on ellipsom-etry,” in Polarization Analysis and Measurement, D. H. Goldstein and R. A. Chipman, eds., Proc. SPIE 1746, 119-127 (1992).
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Nee, S.-M.F.1
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2
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Effects of near-specular scattering on polarim-etry
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D. H. Goldstein and D. B. Chenault, eds., Proc. SPIE
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S.-M. F. Nee, “Effects of near-specular scattering on polarim-etry,” in Polarization Analysis and Measurement II, D. H. Goldstein and D. B. Chenault, eds., Proc. SPIE 2265, 304-313 (1994).
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Polarization Analysis and Measurement II
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Nee, S.-M.F.1
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3
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0000173368
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Polarization of specular reflection and nearspecular scattering by a rough surface
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S.-M. F. Nee, “Polarization of specular reflection and nearspecular scattering by a rough surface,” Appl. Opt. 35, 3570-3582 (1996).
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Appl. Opt.
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Nee, S.-M.F.1
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4
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0026986290
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Birefringence characterization using transmission ellipsometry
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D. H. Goldstein and R. A. Chipman, eds., Proc. SPIE
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S.-M. F. Nee, “Birefringence characterization using transmission ellipsometry,” in Polarization Analysis and Measurement, D. H. Goldstein and R. A. Chipman, eds., Proc. SPIE 1746, 269-280 (1992).
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Polarization Analysis and Measurement
, vol.1746
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Nee, S.-M.F.1
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5
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North-Holland, Amsterdam, Sections 2.12, 3.8, and Appendix
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R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977), Sections 2.12, 3.8, and Appendix.
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R. M. A. Azzam and N. M. Bashara, “Ellipsometry with imperfect components including incoherent effects,” J. Opt. Soc. Am. 61, 1380-1391 (1971).
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85010089528
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The Measurement, Instrumentation and Sensors Handbook, J. G. Webster, ed. (CRC, Boca Raton, Fla.,), Chap. 60
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S. -M. F. Nee, “Polarization measurement,” in The Measurement, Instrumentation and Sensors Handbook, J. G. Webster, ed. (CRC, Boca Raton, Fla., 1999), Chap. 60.
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Polarization Measurement
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Nee, S.-M.F.1
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9
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0031646671
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Characterization of imperfect polarizers under imperfect conditions
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S. F. Nee, C. Yoo, T. Cole, and D. Burge, “Characterization of imperfect polarizers under imperfect conditions,” Appl. Opt. 37, 57-64 (1998).
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Appl. Opt.
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Nee, S.F.1
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10
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0009326153
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Time resolved ellipsometry
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G. E. Jellison Jr. and D. H. Lowndes, “Time resolved ellipsometry,” Appl. Opt. 24, 2948-2955 (1985).
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Depolarization criterion for incoherent scattering
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Depolarization/mixed polarization corrections of ellipsometry spectra
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J. Th. Zettler, Th. Trepk, L. Spanos, Y. Z. Hu, and W. Richter, “High precision UV-visible-near-IR Stokes vector spectroscopy,” Thin Solid Films 234, 402-407 (1993).
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Depolarization and cross polarization in el-lipsometry of rough surfaces
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Characterization of infrared polarizers
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D. H. Goldstein and D. B. Chenault, eds., Proc. SPIE
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S. -M. F. Nee, T. Cole, C. Yoo, and D. Burge, “Characterization of infrared polarizers,” in Conference of Polarization: Measurement, Analysis, and Remote Sensing, D. H. Goldstein and D. B. Chenault, eds., Proc. SPIE 3121, 213-224 (1997).
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, vol.3121
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0032224227
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Polarization of scattering by rough surfaces
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Z.-H. Gu and A. A. Maradudin, eds., Proc. SPIE
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S.-M. F. Nee and T. W. Nee, “Polarization of scattering by rough surfaces,” in Scattering and Surface Roughness II, Z.-H. Gu and A. A. Maradudin, eds., Proc. SPIE 3426, 169-180 (1998).
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Scattering and Surface Roughness II
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0032001221
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Effects of depolarization of optical components on null ellipsometry
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S.-M. F. Nee and T. Cole, “Effects of depolarization of optical components on null ellipsometry,” Thin Solid Films 313-314, 90-96 (1998).
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(1998)
Thin Solid Films
, vol.313-314
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19
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Reflection, scattering and polarization from very rough surfaces
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J. C. Stover, ed., Proc. SPIE
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S. F. Nee, J. M. Bennett, and P. C. Archibald, “Reflection, scattering and polarization from very rough surfaces,” in Optical Scattering: Applications, Measurement, and Theory II, J. C. Stover, ed., Proc. SPIE 1995, 202-212 (1993).
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, vol.1995
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Nee, S.F.1
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Archibald, P.C.3
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Sample depolarization effects from thin films of ZnS on GaAs as measured by spectroscopic ellipsometry
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G. E. Jellison Jr. and J. W. McCamy, “Sample depolarization effects from thin films of ZnS on GaAs as measured by spectroscopic ellipsometry,” Appl. Phys. Lett. 61, 512-514 (1992).
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Problem of polarization degree in spectroscopic photometric ellipsometry (Polarimetry)
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The influences of roughness on film thickness measurements by Mueller matrix ellipsometry
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Influence of incoherent superposition of light on ellipsometric coefficients
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Realtime control by multiwavelength ellipsometry of plasma-deposited multilayers on glass by use of an incoherent-reflection model
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, vol.313-314
, pp. 102-107
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Measurement of the absorption edge of thick transparent substrates using the incoherent reflection model and spectroscopic UV-visible-near IR ellipsometry
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M. Kildemo, R. Ossikovski, and M. Stchakovsky, “Measurement of the absorption edge of thick transparent substrates using the incoherent reflection model and spectroscopic UV-visible-near IR ellipsometry,” Thin Solid Films 313-314, 108-113 (1998).
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Spectroscopic ellipsometry data analysis: Measured versus calculated quantities
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84975594853
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Error reduction for a serious compensator imperfection for null ellipsometry
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S.-M. F. Nee, “Error reduction for a serious compensator imperfection for null ellipsometry,” J. Opt. Soc. Am. A 8, 314-321 (1991).
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J. Opt. Soc. Am. A
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Interstellar polarization in an irregularly fluctuating medium
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S. F. Nee and J. R. Jokipii, “Interstellar polarization in an irregularly fluctuating medium,” Astrophys. J. 234, 140-153 (1979).
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Fluctuation theory of starlight polarization
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S. F. Nee, “Fluctuation theory of starlight polarization,” As-trophys. J. 237, 471-481 (1980).
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As-Trophys. J.
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A simple high precision extinction method for measuring refractive index of transparent materials
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H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. New-nam, and M. J. Soileau, eds., Proc. SPIE
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S. F. Nee and H. E. Bennett, “A simple high precision extinction method for measuring refractive index of transparent materials,” in Laser-Induced Damage in Optical Materials: 1990, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. New-nam, and M. J. Soileau, eds., Proc. SPIE 1441, 31-37 (1990).
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Laser-Induced Damage in Optical Materials: 1990
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Accurate null polarimetry for measuring the refractive index of transparent materials
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S. F. Nee and H. E. Bennett, “Accurate null polarimetry for measuring the refractive index of transparent materials,” J. Opt. Soc. Am. A 10, 2076-2083 (1993).
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(1993)
J. Opt. Soc. Am. A
, vol.10
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Nee, S.F.1
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