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Volumn 77, Issue 2, 2000, Pages 268-270
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Study of the crystalline quality of exfoliated surfaces in hydrogen-implanted silicon
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001521337
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.126946 Document Type: Article |
Times cited : (9)
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References (14)
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