Imaging of the strain field around precipitate particles using transmission ion channeling

Journal of Applied Physics

Volumn 80, Issue 5, 1996, Pages 2671-2679

  King, P J C ^a,c   Breese, M B H ^a,c   Meekeson, D ^a   Smulders, P J M ^b   Wilshaw, P R ^a   Grime, G W ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b UNIVERSITY OF GRONINGEN   (Netherlands)

^c RUTHERFORD APPLETON LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041815576     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363184     Document Type: Article

References (14)

1. L. C. Feldman, J. W. Mayer, and S. T. Picraux, Materials Analysis By Ion Channeling (Academic, New York, 1982).
2. M. B. H. Breese, P. J. C. King, J. Whitehurst, G. R. Booker, G. W. Grime, F. Watt, L. T. Romano, and E. H. C. Parker, J. Appl. Phys. 73, 2640 (1993).
3. P. J. C. King, M. B. H. Breese, P. R. Wilshaw, G. R. Booker, G. W. Grime, F. Watt, and M. J. Goringe, in Microscopy of Semiconducting Materials, edited by A. G. Cullis, A. E. Staton-Bevan, and J. L. Hutchinson (Institute of Physics, 1993), Ser. 134, p. 153.
4. M. B. H. Breese, P. J. C. King, P. J. M. Smulders, and G. W. Grime, Phys. Rev. B 51, 2742 (1995).
5. P. J. C. King, M. B. H. Breese, P. J. M. Smulders, A. J. Wilkinson, G. R. Booker, E. H. C. Parker, and G. W. Grime, Appl. Phys. Lett. 67, 3566 (1995).
6. P. J. C. King, M. B. H. Breese, P. R. Wilshaw, and G. W. Grime, Phys. Rev. B 51, 2732 (1995).
7. P. J. C. King, M. B. H. Breese, P. R. Wilshaw, and G. W. Grime, Phys. Rev. Lett. 74, 411 (1995).
8. M. de Coteau, P. R. Wilshaw, and R. Falster, in Proceedings of 7th Oxford Conference on the Microscopy of Semiconducting Materials, edited by A. G. Cullis and N. J. Long (Institute of Physics, 1991), Ser. 117, p. 231.
9. M. de Coteau. Ph.D. thesis, University of Oxford, 1993.
10. G. W. Grime, M. Dawson, M. Marsh, I. C. McArthur, and F. Watt, Nucl. Instrum. Methods B 54, 52 (1991).
11. P. J. M. Smulders and D. O. Boerma, Nucl. Instrum. Methods B 29, 471 (1987).
12. P. J. Smulders , D. O. Berma, and M. Shaanan, Nucl. Instrum. Methods B 45, 450 (1990).
13. A. Dygo, W. N. Lennard, I. V. Mitchell, and P. J. M. Smulders, Nucl. Instrum. Methods B 90, 161 (1994).
14. P. Hirsch, A. Howie, R. Nicholson, D. W. Pashley, and M. J. Whelan, Electron Microscopy of Thin Crystals (Krieger, Florida, 1977).