Low frequency noise in intrinsic low pressure chemical vapour deposited polycrystalline silicon resistors

Proceedings of the International Conference on Noise in Physical Systems and 1/f Fluctuations

Volumn , Issue , 1997, Pages 434-437

  Dimitriadis, C A ^a   Brini, J ^a   Kamarinos, G ^a  

^a ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CHEMICAL VAPOR DEPOSITION; ELECTRIC FREQUENCY MEASUREMENT; ENERGY GAP; POLYCRYSTALLINE MATERIALS; SPURIOUS SIGNAL NOISE;

LOW PRESSURE CHEMICAL VAPOR DEPOSITION (LPCVD);

RESISTORS;

EID: 0031295841     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)