On the threshold voltage and channel conductance of polycrystalline silicon thin-film transistors

Journal of Applied Physics

Volumn 79, Issue 8, 1996, Pages 4431-4437

  Dimitriadis, C A ^a   Tassis, D H ^a  

^a ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000854914     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.361752     Document Type: Article

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