|
Volumn 86, Issue 4, 1999, Pages 1874-1877
|
Electrical characterization of ZnO ceramics by scanning tunneling spectroscopy and beam-induced current in the scanning tunneling microscope
|
Author keywords
[No Author keywords available]
|
Indexed keywords
|
EID: 0001508495
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.370982 Document Type: Article |
Times cited : (12)
|
References (19)
|