Development of an scanning tunneling microscopy-based electron beam induced current (EBIC) microscope

Scanning Microscopy

Volumn 10, Issue 1, 1996, Pages 33-38

  Koschinski, P ^a   Dworak, V ^a   West, P E ^b   Balk, L J ^a  

^a UNIVERSITY OF WUPPERTAL   (Germany)

^b TopoMetrix Corporation   (United States)

Author keywords

Electron beam induced current; Scanning tunneling microscope

Indexed keywords

ARTICLE; BIOMECHANICS; ELECTRON TRANSPORT; HUMAN; MEDICAL INSTRUMENTATION; PRIORITY JOURNAL; SCANNING TUNNELING MICROSCOPY;

EID: 0030316465     PISSN: 08917035     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (6)

1. Gomer R (1961) Field ionization and related phenomena. In: Field Emission and Field Ionization. Harvard Monographs in Applied Science 9: 64-103.
2. Koschinski P, Kaufmann K, Balk LJ (1994a) EBIC-Investigations of grain boundaries in diamond films with SEM and STM. In: Proceedings of the 13th International Congress on Electron Microscopy (ICEM). pp. 17-22. July 1994, Paris. Les éditions de physique, 1121-1122.
3. Koschinski P, Dworak V, Balk LJ (1994b) High resolution electron beam induced current measurements in an scanning tunneling microscope on GaAs-MESFET. Scanning Microsc 8: 175-180.
4. Leamy HJ (1992) Charge collection scanning electron microscopy. J Appl Phys 53: R51-R80.
5. Wiesendanger R, Güntherodt HJ (1993) Scanning Tunneling Microscopy III. Springer Series in Surface Science 29. Springer-Verlag, New York. pp. 7-75.
6. Wong TKS, Ingram SG (1993) Observational of Fowler-Nordheim tunnelling at atmospheric pressure using Au/Ti lateral tunnel diodes. J Phys D: Appl Phys 26: 979-985.