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Volumn 71, Issue 19, 1997, Pages 2830-2832

Remote electron beam induced current imaging of electrically active regions in YBa2Cu3O7-x single crystals

Author keywords

[No Author keywords available]

Indexed keywords

CATHODOLUMINESCENCE; HIGH TEMPERATURE SUPERCONDUCTORS; OHMIC CONTACTS; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; SURFACES;

EID: 0031275416     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120419     Document Type: Article
Times cited : (5)

References (19)
  • 8
    • 0002887012 scopus 로고
    • edited by D. B. Holt and D. C. Joy Academic, New York
    • D. B. Holt, in SEM Microcharacterization of Semiconductors, edited by D. B. Holt and D. C. Joy (Academic, New York, 1989), pp. 241-338.
    • (1989) SEM Microcharacterization of Semiconductors , pp. 241-338
    • Holt, D.B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.