SCOPUS 정보 검색 플랫폼

Volumn 453, Issue 1-3, 2000, Pages 18-24

Structure determination of the Si(001)-(2 × 1)-H reconstruction by surface X-ray diffraction: Weakening of the dimer bond by the addition of hydrogen

(8) Lauridsen, E M a Baker, J a Nielsen, M a Feidenhans'l, R a Falkenberg, G b Bunk, O b Zeysing, J H b Johnson, R L b

a TECHNICAL UNIVERSITY OF DENMARK (Denmark)

b UNIVERSITY OF HAMBURG (Germany)

Author keywords

Hydrogen atom; Silicon; Surface relaxation and reconstruction; X ray scattering, diffraction, and reflection

Indexed keywords

EID: 0001452106 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(00)00314-9 Document Type: Article

Times cited : (18)

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