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Integrated Ferroelectrics

Volumn 22, Issue 1-4, 1998, Pages 237-244

Microscopic observation of "region by region" polarisation domains freezing during fatigue of the Pt-PZT-Pt system

(6) Colla, E L a Taylor, D V a Hong, Seungbum b Tagantsev, A K a No, Kwangsoo b Setter, N a

a EPFL (Switzerland)

b Korea Advanced Institute of Science and Technology (KAIST) (South Korea)

Author keywords

AFM; Fatigue; FECAP; FERAM; Ferroelectric memories; Piezoelectric; PZT; Thin films

Indexed keywords

CAPACITORS; CRYSTAL GROWTH; CRYSTAL LATTICES; ELECTRODES; FATIGUE OF MATERIALS; FERROELECTRIC MATERIALS; FILM GROWTH; INTERFACES (MATERIALS); LEAD COMPOUNDS; NUCLEATION; POLARIZATION; THIN FILMS;

LEAD ZIRCONATE TITANATE;

DIELECTRIC FILMS;

EID: 0032308912 PISSN: 10584587 EISSN: None Source Type: Journal
DOI: 10.1080/10584589808208045 Document Type: Article

Times cited : (7)

References (11)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.