A new interpretation of bulge test measurements using numerical simulation

Diamond and Related Materials

Volumn 5, Issue 6-8, 1996, Pages 635-639

  Von Kaenel, Y ^a   Giachetto, J Ch ^a   Stiegler, J ^a   Drezet, J M ^a   Blank, E ^a  

^a EPFL   (Switzerland)

Author keywords

Bulge test measurements; CVD diamond; Numerical simulation; Thin films; Young's modulus

Indexed keywords

EID: 0006710538     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/0925-9635(95)00402-5     Document Type: Article

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