The effects of ferroelectric capacitor testing methods on predicted imprint failure points

Integrated Ferroelectrics

Volumn 16, Issue 1-4, 1997, Pages 87-96

  Suizu, Robert I ^a   Chapman, Scott P ^a  

^a Radiant Technologies Incorporated   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; FAILURE ANALYSIS; FATIGUE OF MATERIALS; FERROELECTRIC DEVICES; HIGH TEMPERATURE TESTING;

FERROELECTRIC CAPACITORS; IMPRINT MECHANISMS;

DATA STORAGE EQUIPMENT;

EID: 0031361423     PISSN: 10584587     EISSN: None     Source Type: Journal    
DOI: 10.1080/10584589708013032     Document Type: Article

References (3)

1. N.E. Abt, "Anomalous Remanent Polarization in Ferroelectric Capacitors", Proceedings of the 3rd International Symposium on Integrated Ferroelectrics, pp. 404-413 (1991).
2. J.T. Evans Jr. and H.E. Cardoza, Integrated Ferroelectrics, 10, pp. 267-278 (1995).
3. R. Ramesh, W.L. Warren, G.E. Pike, D. Dimos, B.A. Tuttle, and J.T. Evans Jr, "Hysteresis Relaxation in (Pb,La)(Zr,Ti)O3 Thin Film Capacitors with La-Sr-Co-O Electrodes", unpublished paper (1995)