High-accuracy absolute distance measurement by means of wavelength scanning heterodyne interferometry

Measurement Science and Technology

Volumn 9, Issue 7, 1998, Pages 1031-1036

  Xioli, Dai ^a   Katuo, Seta ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Absolute distance; Frequency scanning; Heterodyne detection; Interferometer; Laser diode

Indexed keywords

HETERODYNING; INTERFEROMETERS; SCANNING; SEMICONDUCTOR LASERS;

HIGH ACCURACY ABSOLUTE DISTANCE MEASUREMENT; WAVELENGTH SCANNING HETERODYNE INTERFEROMETRY;

DISTANCE MEASUREMENT;

EID: 0032116948     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/9/7/004     Document Type: Article

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