High-resolution imaging using near-field scanning optical microscopy and shear force feedback in water

Applied Physics Letters

Volumn 68, Issue 24, 1996, Pages 3380-3382

  Moyer, Patrick J ^a   Kämmer, Stefan B ^a  

^a TopoMetrix Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000061065     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116510     Document Type: Article

References (9)

1. O. Marti and M. Amrein, STM and SFM in Biology (Academic, San Diego, 1993).
2. D. W. Pohl, W. Denk, and M. Lanz, Appl. Phys. Lett. AIP 44, 651 (1984).
3. E. Betzig and J. K. Trautman, Science INS 257, 189 (1992).
4. E. Betzig, P. L. Finn, and J. S. Weiner, Appl. Phys. Lett. AIP 60, 2484 (1992).
5. R. Toledo-Crow, P. C. Yang, Y. Chen, and M. Vaez-Iravani, Appl. Phys. Lett. AIP 60, 2957 (1992).
6. U. C. Fischer and H. P. Zingsheim, J. Vac. Sci. Technol. AIP 19, 881 (1981).
7. Y. Martin, C. C. Williams, and H. K. Wickramasinghe, J. Appl. Phys. AIP 61, 4723 (1987).
8. M. A. Lantz, S. J. O'Shea, and M. E. Welland, Appl. Phys. Lett. AIP 65, 409 (1994).
9. P. K. Hansma, J. P. Cleveland, M. Radmacher, D. A. Walters, P. E. Hillner, M. Bezanilla, M. Fritz, D. Vie, H. G. Hansma, C. B. Prater, J. Massie, L. Fukunaga, J. Gurley, and V. Ellings, Appl. Phys. Lett. AIP 64, 1738 (1994).