TEM study of yielding in polycrystalline gold thin films

Materials Research Society Symposium - Proceedings

Volumn 505, Issue , 1998, Pages 383-388

  Owusu Boahen, Kwame ^a   King, Alexander H ^a  

^a STONY BROOK UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRACKS; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; DISLOCATIONS (CRYSTALS); FILM GROWTH; GOLD; GRAIN GROWTH; POLYCRYSTALLINE MATERIALS; TENSILE STRENGTH; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

PLASTIC YIELDING; SCHMID FACTORS;

METALLIC FILMS;

EID: 0031622408     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)