Piezoreflectance study of an Fe-containing silicon carbon nitride crystalline film

Journal of Applied Physics

Volumn 87, Issue 1, 2000, Pages 280-284

  Hsieh, C H ^a   Huang, Y S ^a   Tiong, K K ^b   Fan, C W ^c   Chen, Y F ^c   Chen, L C ^c   Wu, J J ^d   Chen, K H ^d  

^a NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^b NATIONAL TAIWAN OCEAN UNIVERSITY   (Taiwan)

^c NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^d INSTITUTE OF ATOMIC AND MOLECULAR SCIENCES   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000918038     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.371856     Document Type: Article

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