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Volumn 524, Issue , 1998, Pages 49-54
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Automated indexing of Laue images from polycrystalline materials
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Author keywords
[No Author keywords available]
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Indexed keywords
ALGORITHMS;
CRYSTAL MICROSTRUCTURE;
CRYSTAL ORIENTATION;
LIGHT REFLECTION;
STRAIN MEASUREMENT;
X RAY CRYSTALLOGRAPHY;
X RAY SCATTERING;
LAUE IMAGING;
REFLECTION INDEX;
POLYCRYSTALLINE MATERIALS;
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EID: 0031635287
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-524-49 Document Type: Conference Paper |
Times cited : (2)
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References (13)
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