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Volumn 74, Issue 7, 1999, Pages 994-996

In situ scanning tunneling microscopy study of C-induced Ge quantum dot formation on Si(100)

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Indexed keywords

EID: 0000899634 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.123434 Document Type: Article

Times cited : (41)

References (14)

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