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Volumn 60, Issue 3, 1999, Pages 2101-2105

Direct experimental observation of different diffusive transport regimes in semiconductor nanostructures

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Indexed keywords


EID: 0000883420     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.60.2101     Document Type: Article
Times cited : (30)

References (30)
  • 13
    • 85037892985 scopus 로고    scopus 로고
    • J. F. Ziegler, J. P. Biersack, and U. Littmark, The Stopping and Range of Ions in Solids (Pergamon, New York, 1989), Vol. 1.
    • J. F. Ziegler, J. P. Biersack, and U. Littmark, The Stopping and Range of Ions in Solids (Pergamon, New York, 1989), Vol. 1.
  • 17
    • 85037915691 scopus 로고    scopus 로고
    • The recombination times in samples A and B are not due to intrinsic radiative recombination but result from nonradiative decay due to a small laterally uniform background implantation dose applied in the FIB patterning process. The background implantation dose varies between FIB implantation runs. This results in different recombination times in samples A and B
    • The recombination times in samples A and B are not due to intrinsic radiative recombination but result from nonradiative decay due to a small laterally uniform background implantation dose applied in the FIB patterning process. The background implantation dose varies between FIB implantation runs. This results in different recombination times in samples A and B.
  • 28
    • 85037899949 scopus 로고    scopus 로고
    • For very long time delays, the measured pump-probe signal is so small that noise prevents detailed analysis. Therefore, only the calculated trace is shown in Fig. 33.
    • For very long time delays, the measured pump-probe signal is so small that noise prevents detailed analysis. Therefore, only the calculated trace is shown in Fig. 33.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.