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Volumn 71, Issue 1-4, 1998, Pages 213-223
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Ultrafast measurement in GaAs thin films using NSOM
a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
COOLING;
EPITAXIAL GROWTH;
MICROSTRUCTURE;
RELAXATION PROCESSES;
SEMICONDUCTING GALLIUM ARSENIDE;
SPECTROSCOPY;
THIN FILMS;
EQUAL PULSE CORRELATION TECHNIQUE;
NEAR FIELD SCANNING OPTICAL MICROSCOPY;
ULTRAFAST MEASUREMENT;
OPTICAL MICROSCOPY;
ARTICLE;
CORRELATION FUNCTION;
FILM;
IMAGE RECONSTRUCTION;
IMAGING;
SCANNING NEAR FIELD OPTICAL MICROSCOPY;
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EID: 0032033220
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/S0304-3991(97)00062-4 Document Type: Article |
Times cited : (38)
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References (18)
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