-
1
-
-
0001561491
-
Error analysis of null ellipsometry with depolarization
-
S.-M. F. Nee, “Error analysis of null ellipsometry with depolarization,” Appl. Opt. 38, 5388-5398 (1999).
-
(1999)
Appl. Opt.
, vol.38
, pp. 5388-5398
-
-
Nee, S.-M.F.1
-
2
-
-
0032001221
-
Effects of depolarization of optical components on null ellipsometry
-
S.-M. F. Nee and Teresa Cole, “Effects of depolarization of optical components on null ellipsometry,” Thin Solid Films 313-314, 90-96 (1998).
-
(1998)
Thin Solid Films
, vol.313-314
, pp. 90-96
-
-
Nee, S.-M.F.1
Cole, T.2
-
3
-
-
0026960616
-
The effects of incoherent scattering on ellipsometry
-
D. H. Goldstein and R. A. Chipman, eds., Proc. SPIE
-
S.-M. F. Nee, “The effects of incoherent scattering on ellipsometry,” in Polarization Analysis and Measurement, D. H. Goldstein and R. A. Chipman, eds., Proc. SPIE 1746, 119-127 (1992).
-
(1992)
Polarization Analysis and Measurement
, vol.1746
, pp. 119-127
-
-
Nee, S.-M.F.1
-
4
-
-
0026986290
-
Birefringence characterization using transmission ellipsometry
-
D. H. Goldstein and R. A. Chipman, eds., Proc. SPIE
-
S.-M. F. Nee, “Birefringence characterization using transmission ellipsometry,” in Polarization Analysis and Measurement, D. H. Goldstein and R. A. Chipman, eds., Proc. SPIE 1746, 269 -280 (1992).
-
(1992)
Polarization Analysis and Measurement
, vol.1746
-
-
Nee, S.-M.F.1
-
5
-
-
0001077335
-
Depolarization and retardation of a birefrein-gent slab
-
S.-M. F. Nee, “Depolarization and retardation of a birefrein-gent slab,” J. Opt. Soc. Am. A 17, 2067-2073 (2000).
-
(2000)
J. Opt. Soc. Am. A
, vol.17
, pp. 2067-2073
-
-
Nee, S.-M.F.1
-
6
-
-
0000173368
-
Polarization of specular reflection and nearspecular scattering by a rough surface
-
S.-M. F. Nee, “Polarization of specular reflection and nearspecular scattering by a rough surface,” Appl. Opt. 35, 3570-3582 (1996).
-
(1996)
Appl. Opt.
, vol.35
, pp. 3570-3582
-
-
Nee, S.-M.F.1
-
7
-
-
0028758289
-
Effects of near-specular scattering on polarim-etry
-
D. H. Goldstein and David B. Chenault, eds., Proc. SPIE
-
S.-M. F. Nee, “Effects of near-specular scattering on polarim-etry,” in Polarization Analysis and Measurement II, D. H. Goldstein and David B. Chenault, eds., Proc. SPIE 2265, 304-313 (1994).
-
(1994)
Polarization Analysis and Measurement II
, vol.2265
, pp. 304-313
-
-
Nee, S.-M.F.1
-
8
-
-
0037934959
-
Interstellar polarization in an irregularly fluctuating medium
-
S. F. Nee and J. R. Jokipii, “Interstellar polarization in an irregularly fluctuating medium,” Astrophys. J. 234, 140-153 (1979).
-
(1979)
Astrophys. J.
, vol.234
, pp. 140-153
-
-
Nee, S.F.1
Jokipii, J.R.2
-
9
-
-
0037597076
-
Fluctuation theory of starlight polarization
-
S. F. Nee, “Fluctuation theory of starlight polarization,” Astrophys. J. 237, 471-481 (1980).
-
(1980)
Astrophys. J.
, vol.237
, pp. 471-481
-
-
Nee, S.F.1
-
10
-
-
0019597239
-
Relationships between elements of the Stokes matrix
-
E. S. Fry and G. W. Kattawar, “Relationships between elements of the Stokes matrix,” Appl. Opt. 20, 2811-2814 (1981).
-
(1981)
Appl. Opt.
, vol.20
, pp. 2811-2814
-
-
Fry, E.S.1
Kattawar, G.W.2
-
11
-
-
84975576423
-
Relationship between Jones and Mueller matrices for random media
-
K. Kim, L. Mandel, and E. Wolf, “Relationship between Jones and Mueller matrices for random media,” J. Opt. Soc. Am. A 4, 433-437 (1987).
-
(1987)
J. Opt. Soc. Am. A
, vol.4
, pp. 433-437
-
-
Kim, K.1
Mandel, L.2
Wolf, E.3
-
12
-
-
84904731600
-
Problem of polarization degree in spectroscopic photometric ellipsometry (Polarimetry)
-
A. Roseler, “Problem of polarization degree in spectroscopic photometric ellipsometry (polarimetry),” J. Opt. Soc. Am. A 9, 1124-1131 (1992).
-
(1992)
J. Opt. Soc. Am. A
, vol.9
, pp. 1124-1131
-
-
Roseler, A.1
-
13
-
-
0000092297
-
Emission polarization of roughened glass and aluminum surfaces
-
D. L. Jordan, G. D. Lewis, and E. Jakeman, “Emission polarization of roughened glass and aluminum surfaces,” Appl. Opt. 35, 3583-3590 (1996).
-
(1996)
Appl. Opt.
, vol.35
, pp. 3583-3590
-
-
Jordan, D.L.1
Lewis, G.D.2
Jakeman, E.3
-
14
-
-
0005807653
-
Influence of incoherent superposition of light on ellipsometric coefficients
-
R. Joerger, K. Forcht, A. Gombert, M. Kohl, and W. Graf, “Influence of incoherent superposition of light on ellipsometric coefficients,” Appl. Opt. 36, 319-327 (1997).
-
(1997)
Appl. Opt.
, vol.36
, pp. 319-327
-
-
Joerger, R.1
Forcht, K.2
Gombert, A.3
Kohl, M.4
Graf, W.5
-
15
-
-
0005814730
-
Realtime control by multiwavelength ellipsometry of plasma-deposited multilayers on glass by use of an incoherent-reflection model
-
M. Kildemo, P. Bulkin, B. Drevillon, and O. Hunderi, “Realtime control by multiwavelength ellipsometry of plasma-deposited multilayers on glass by use of an incoherent-reflection model,” Appl. Opt. 36, 6352-6359 (1997).
-
(1997)
Appl. Opt.
, vol.36
, pp. 6352-6359
-
-
Kildemo, M.1
Bulkin, P.2
Drevillon, B.3
Hunderi, O.4
-
16
-
-
0003364304
-
Polarization measurement
-
J. G. Webster, ed.CRC Press, Boca Raton, Fla, Chap
-
S.-M. F. Nee, “Polarization measurement,” in The Measurement, Instrumentation and Sensors Handbook, J. G. Webster, ed. (CRC Press, Boca Raton, Fla., 1999), Chap. 60.
-
(1999)
The Measurement, Instrumentation and Sensors Handbook
, pp. 60
-
-
Nee, S.-M.F.1
-
18
-
-
0000973619
-
Polarimetry
-
McGraw-Hill, New York
-
R. A. Chipman, “Polarimetry,” in Handbook of Optics (McGraw-Hill, New York, 1995), Vol. II, Chap. 22.
-
(1995)
Handbook of Optics
, vol.2
, pp. 22
-
-
Chipman, R.A.1
-
20
-
-
0009326153
-
Time resolved ellip-sometry
-
G. E. Jellison, Jr., and D. H. Lowndes, “Time resolved ellip-sometry,” Appl. Opt. 24, 2948-2955 (1985).
-
(1985)
Appl. Opt
, vol.24
, pp. 2948-2955
-
-
Jellison, G.E.1
Lowndes, D.H.2
-
21
-
-
0000228743
-
Sample depolarization effects from thin films of ZnS on GaAs as measured by spectroscopic ellipsometry
-
G. E. Jellison, Jr., and J. W. McCamy, “Sample depolarization effects from thin films of ZnS on GaAs as measured by spectroscopic ellipsometry,” Appl. Phys. Lett. 61, 512-514 (1992).
-
(1992)
Appl. Phys. Lett
, vol.61
, pp. 512-514
-
-
Jellison, G.E.1
Mc Camy, J.W.2
-
22
-
-
0032000202
-
Depolarization/mixed polarization corrections of ellipsometry spectra
-
U. Rossow, “Depolarization/mixed polarization corrections of ellipsometry spectra,” Thin Solid Films 313-314, 97-101 (1998).
-
(1998)
Thin Solid Films
, vol.313-314
, pp. 97-101
-
-
Rossow, U.1
-
23
-
-
0031646671
-
Characterization of imperfect polarizers under imperfect conditions
-
S. F. Nee, C. Yoo, T. Cole, and D. Burge, “Characterization of imperfect polarizers under imperfect conditions,” Appl. Opt. 37, 57-64 (1998).
-
(1998)
Appl. Opt.
, vol.37
, pp. 57-64
-
-
Nee, S.F.1
Yoo, C.2
Cole, T.3
Burge, D.4
-
24
-
-
0032224227
-
Polarization of scattering by rough surfaces
-
Z. Gu and A. A. Maradudin, eds., Proc. SPIE
-
S.-M. F. Nee and T.-W. Nee, “Polarization of scattering by rough surfaces,” in Conference of Scattering and Surface Roughness II, Z. Gu and A. A. Maradudin, eds., Proc. SPIE 3426, 169-180 (1998).
-
(1998)
Conference of Scattering and Surface Roughness II
, vol.3426
, pp. 169-180
-
-
Nee, S.-M.F.1
Nee, T.-W.2
-
25
-
-
0031289030
-
Characterization of infrared polarizers
-
D. H. Goldstein and D. B. Chenault, eds., Proc. SPIE
-
S. F. Nee, T. Cole, C. Yoo, and D. Burge, “Characterization of infrared polarizers,” in Polarization: Measurement, Analysis, and Remote Sensing, D. H. Goldstein and D. B. Chenault, eds., Proc. SPIE 3121, 213-224 (1997).
-
(1997)
Polarization: Measurement, Analysis, and Remote Sensing
, vol.3121
, pp. 213-224
-
-
Nee, S.F.1
Cole, T.2
Yoo, C.3
Burge, D.4
-
26
-
-
84975609171
-
Error analysis of a Mueller matrix polarimenter
-
D. H. Goldstein and R. A. Chipman, “Error analysis of a Mueller matrix polarimenter,” J. Opt. Soc. Am. A 7, 693-700 (1990).
-
(1990)
J. Opt. Soc. Am. A
, vol.7
, pp. 693-700
-
-
Goldstein, D.H.1
Chipman, R.A.2
-
27
-
-
0015145333
-
Ellipsometry with imperfect components including incoherent effects
-
R. M. A. Azzam and N. M. Bashara, “Ellipsometry with imperfect components including incoherent effects,” J. Opt. Soc. Am. 61, 1380-1391 (1971).
-
(1971)
J. Opt. Soc. Am.
, vol.61
, pp. 1380-1391
-
-
Azzam, R.M.A.1
Bashara, N.M.2
-
28
-
-
84975594853
-
Error reduction for a serious compensator imperfection for null ellipsometry
-
S.-M. F. Nee, “Error reduction for a serious compensator imperfection for null ellipsometry,” J. Opt. Soc. Am. A 8, 314-321 (1991).
-
(1991)
J. Opt. Soc. Am. A
, vol.8
, pp. 314-321
-
-
Nee, S.-M.F.1
-
29
-
-
0005284249
-
The influences of roughness on film thickness measurements by Mueller materix ellipsom-etry
-
D. A. Ramsey and K. C. Ludema, “The influences of roughness on film thickness measurements by Mueller materix ellipsom-etry,” Rev. Sci. Instrum. 65, 2874 -2881 (1994).
-
(1994)
Rev. Sci. Instrum
, vol.65
-
-
Ramsey, D.A.1
Ludema, K.C.2
-
30
-
-
0017983141
-
Photopolarimetric measurement of the Mueller matrix by Fourier analysis of a single detected signal
-
R. M. A. Azzam, “Photopolarimetric measurement of the Mueller matrix by Fourier analysis of a single detected signal,” Opt. Lett. 2, 148-150 (1978).
-
(1978)
Opt. Lett.
, vol.2
, pp. 148-150
-
-
Azzam, R.M.A.1
-
31
-
-
0000416476
-
Mueller matrix dual-rotating retarder polarimeter
-
D. H. Goldstein, “Mueller matrix dual-rotating retarder polarimeter,” Appl. Opt. 31, 6676- 6683 (1992).
-
(1992)
Appl. Opt
, vol.31
-
-
Goldstein, D.H.1
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