Emission polarization of roughened glass and aluminum surfaces

Applied Optics

Volumn 35, Issue 19, 1996, Pages 3583-3590

  Jordan, D L ^a   Lewis, G D ^a   Jakeman, E ^a  

^a DEFENCE SCIENCE AND TECHNOLOGY LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000092297     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.35.003583     Document Type: Article

References (20)

1. F. Arago, Ann. Chim. Phys. 27, 89-90 (1824).
2. C. Acquista, “Polarization properties of natural background materials in the IR,’ in Multispectral Image Processing and Enhancement, M. R. Weathersby, ed., Proc. SPIE 933, 155-158 (1988).
3. R. D. Tooley, ‘Man-made target detection using infrared polarization,’ in Polarization Considerations for Optical Systems II, R. A. Chipman, ed., Proc. SPIE 1166, 52-58 (1989).
4. T. J. Rogne, F. G. Smith, and J. E. Rice, ‘Passive target detection using polarized components of infrared signatures,’ in Polarimetry: Radar, Infrared, Visible, Ultraviolet, and X-Ray, R. A. Chipman and J. W. Morris, eds., Proc. SPIE 1317, 242-251 (1990).
5. D. L. Jordan and G. Lewis, “Measurements of the effect of surface roughness on the polarization state of thermally emitted radiation,’ Opt. Lett. 19, 692-694 (1994).
6. M. Born and E. Wolf, Principles of Optics (Pergamon, London, 1980), Chap. 13, p. 622.
7. P. Beckmann and A. Spizzichino, The Scattering ofElectromag-netic Waves from Rough Surfaces (Pergamon, London, 1963), Chap. 3, pp. 25-33.
8. A. A. Maradudin, R. E. Luna, and E. R. Mendez, ‘The Brewster effect for a one-dimensional random surface,’ Waves Random Media 3, 51-60 (1993).
9. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1970), Chap. 11, pp. 55-59.
10. F. E. Nicodemus, “Directional reflectance and emissivity of an opaque surface,’Appl. Opt. 4, 767-773 (1965).
11. F. E. Nicodemus, “Reflectance nomenclature and directional reflectance and emissivity,’Appl. Opt. 9, 1474-1475 (1970).
12. S. F. Nee, ‘Ellipsometric analysis for surface roughness and texture,’Appl. Opt. 27, 2819-2831 (1988).
13. R. M. Azzam and N. M. Bashara, “Polarization characteristics of scattered radiation from a diffraction grating by ellipsometry with applications to surface roughness,’ Phys. Rev. B 5, 4721-4729 (1972).
14. D. E. Aspnes, ‘Optical properties of thin films,’ Thin Solid Films 89, 249-262 (1982).
15. V. I. Sayapina, D. Ya. Svet, and D. R. Popova, ‘Influence of surface roughness on the emissivity of metals,’ Teplofizika Vys. Temp. 10, 528-535 (1972).
16. D. V. Mikhailova and I. M. Fuks, Emissivity of a statistically rough surface including multiple reflections,” J. Commun. Tech. Electron. 38, 128-136 (1993).
17. R. M. A. Azzam, ‘Ellipsometric configurations and techniques,’ in Optical Characterization Techniques for Semiconductor Technology, D. E. Aspnes, S. So, and R. F. Potter, eds., Proc. SPIE 276, 180-187 (1981).
18. J. R. Blanco and P. J. McMarr, ‘Roughness measurement of Si and Al by variable angle spectroscopic ellipsometry,’ Appl. Opt. 30, 3210-3220 (1991).
19. J. R. Beattie, ‘Optical constants of metals in the infrared-experimental methods,’ Philos. Mag. 46, 235-245 (1955).
20. R. Anderson, ‘Polarized properties of the directional-hemispherical reflectance and emissivity of an opaque surface,’ in Polarization and Remote Sensing, W. G. Egan, ed., Proc. SPIE 1747, 49-59 (1992).