Investigation of strain induced patterning in superlattices by grazing incidence diffraction - comparison of morphological and strain ordering

Journal of Physics D: Applied Physics

Volumn 32, Issue 10 A, 1999, Pages

  Baumbach, G T ^a,c   Giannini, C ^b   Lubbert D ^a,c   Felici, R ^c   Tapfer, L ^b   Marschner, T ^d   Stolz, W ^d  

^a FRAUNHOFER INSTITUTE FOR NON DESTRUCTIVE TESTING   (Germany)

^b Centro Nazionale per la Ricerca e lo Sviluppo dei Materiali   (Italy)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^d PHILIPPS UNIVERSITY MARBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFACES (MATERIALS); MORPHOLOGY; SEMICONDUCTING FILMS; STRAIN; SUBSTRATES; X RAY DIFFRACTION;

GRAZING INCIDENCE DIFFRACTION; LATTICE STRAIN CORRELATION; STRAIN FLUCTUATIONS; STRAIN INDUCED PATTERNING; STRAIN ORDERING; STRAIN SENSITIVE MAPS;

SEMICONDUCTOR SUPERLATTICES;

EID: 0032652005     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/32/10A/341     Document Type: Article

References (9)

1. Kapon E, Hwang D M and Baht R 1989 Phys. Rev. Lett. 63 430
2. Nötzel R, Ledentsov N N, Däweritz L, Hohenstein M and Ploog K 1991 Phys. Rev. Lett. 67 3812
3. Bimberg D, Grundmann M and Ledentsov N N 1998 MRS Bulletin 23 31
4. Tersoff J, Phang Y H, Zhenyu Zhang and Lagally M G 1995 Phys. Rev. Lett. 75 2730
5. Marschner T, Lutgen S, Volk M, Stolz B and Göbel E O 1996 Appl. Phys. Lett. 69 2249
6. Holý V, Giannini C, Tapfer L, Marschner T and Stolz W 1997 Phys. Rev. B 55 9960
7. Giannini C, Tapfer L, Zhuang Y and De Caro L 1997 Phys. Rev. B 55 5276
8. Baumbach G T and Gailhanou M 1995 J. Phys. D: Appl. Phys. 28 2321
9. Pukite P R, Lent C S and Cohen P I 1985 Surf. Sci. 161 39