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Applied Physics Letters

Volumn 74, Issue 3, 1999, Pages 365-367

Elastic strain in In0.18Ga0.82N layer: A combined x-ray diffraction and Rutherford backscattering/channeling study

(7) Wu, M F a,b Vantomme, A b Hogg, S M b Langouche, G b Van Der Stricht, W c Jacobs, K c Moerman, I c

a PEKING UNIVERSITY (China)

b KU LEUVEN (Belgium)

c GHENT UNIVERSITY (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000735510 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.123032 Document Type: Article

Times cited : (41)

References (15)

1
- 21544461610
- H. Morkoc, S. Strite, G. B. Gao, M. E. Lin, B. Sverdlov, and M. Burns, J. Appl. Phys. 76, 1363 (1994).
- (1994) J. Appl. Phys. , vol.76 , pp. 1363
- Morkoc, H.¹ Strite, S.² Gao, G.B.³ Lin, M.E.⁴ Sverdlov, B.⁵ Burns, M.⁶

2
- 0001842332
- S. Nakamura, MRS Bull. 22, 29 (1997).
- (1997) MRS Bull. , vol.22 , pp. 29
- Nakamura, S.¹

3
- 0031348845
- W. Van der Stricht, K. Jacobs, I. Moerman, P. Demeester, L. Considine, E. J. Thrush, J. A. Crawley, and P. Ruterana, Mater. Res. Soc. Symp. Proc. 482, 107 (1998).
- (1998) Mater. Res. Soc. Symp. Proc. , vol.482 , pp. 107
- Van Der Stricht, W.¹ Jacobs, K.² Moerman, I.³ Demeester, P.⁴ Considine, L.⁵ Thrush, E.J.⁶ Crawley, J.A.⁷ Ruterana, P.⁸

4
- 0000060033
- R. Singh, D. Doppalapudi, T. D. Moustakas, and L. T. Romano, Appl. Phys. Lett. 70, 1089 (1997).
- (1997) Appl. Phys. Lett. , vol.70 , pp. 1089
- Singh, R.¹ Doppalapudi, D.² Moustakas, T.D.³ Romano, L.T.⁴

5
- 0002129467
- N. A. El-Masry, E. L. Piner, S. X. Liu, and S, M. Bedair, Appl. Phys. Lett. 72, 40 (1998).
- (1998) Appl. Phys. Lett. , vol.72 , pp. 40
- El-Masry, N.A.¹ Piner, E.L.² Liu, S.X.³ Bedair, S.M.⁴

6
- 0000278416
- H. Z. Xiao, N.-E. Lee, R. C. Powell, Z. Ma, L. J. Chou, L. H. Allen, J. E. Greene, and A. Rockett, J. Appl. Phys. 76, 8195 (1994).
- (1994) J. Appl. Phys. , vol.76 , pp. 8195
- Xiao, H.Z.¹ Lee, N.-E.² Powell, R.C.³ Ma, Z.⁴ Chou, L.J.⁵ Allen, L.H.⁶ Greene, J.E.⁷ Rockett, A.⁸

7
- 21544466840
- R. C. Powell, N.-E. Lee, Y.-W. Kim, and J. E. Greene, J. Appl. Phys. 73, 189 (1993).
- (1993) J. Appl. Phys. , vol.73 , pp. 189
- Powell, R.C.¹ Lee, N.-E.² Kim, Y.-W.³ Greene, J.E.⁴

8
- 84897062779
- T. Detchprohm, K. Hiramatsu, K. Itoh, and I. Akasaki, Jpn. J. Appl. Phys., Part 2 31, L1454 (1992).
- (1992) Jpn. J. Appl. Phys., Part 2 , vol.31
- Detchprohm, T.¹ Hiramatsu, K.² Itoh, K.³ Akasaki, I.⁴

9
- 0000817340
- T. Kachi, K. Tomita, K. Itoh, and H. Tadano, Appl. Phys. Lett. 72, 704 (1998).
- (1998) Appl. Phys. Lett. , vol.72 , pp. 704
- Kachi, T.¹ Tomita, K.² Itoh, K.³ Tadano, H.⁴

10
- 0031069650
- M. S. Shur and M. A. Khan, MRS Bull. 22, 44 (1997).
- (1997) MRS Bull. , vol.22 , pp. 44
- Shur, M.S.¹ Khan, M.A.²

11
- 0031072477
- T. Takeuchi, H. Takeuchi, S. Sota, H. Sakai, H. Amano, and I. Akasaki, Jpn. J. Appl. Phys., Part 2 36, L177 (1997).
- (1997) Jpn. J. Appl. Phys., Part 2 , vol.36
- Takeuchi, T.¹ Takeuchi, H.² Sota, S.³ Sakai, H.⁴ Amano, H.⁵ Akasaki, I.⁶

12
- 0000723959
- B. J. Skromme, H. Zhao, D. Wang, H. S. Kong, M. T. Leonard, G. E. Bulman, and R. J. Molnar, Appl. Phys. Lett. 71, 829 (1997).
- (1997) Appl. Phys. Lett. , vol.71 , pp. 829
- Skromme, B.J.¹ Zhao, H.² Wang, D.³ Kong, H.S.⁴ Leonard, M.T.⁵ Bulman, G.E.⁶ Molnar, R.J.⁷

13
- 0004198677
- Academic, New York
- W. K. Chu, J. W. Mayer, and M. A. Nicolet, Backscattering Spectrometry (Academic, New York, 1978).
- (1978) Backscattering Spectrometry
- Chu, W.K.¹ Mayer, J.W.² Nicolet, M.A.³

14
- 0342947803
- M. F. Wu, A. Vantomme, J. De Wachter, S. Degroote, H. Pattyn, G. Langouche, and H. Bender, J. Appl. Phys. 79, 6920 (1996).
- (1996) J. Appl. Phys. , vol.79 , pp. 6920
- Wu, M.F.¹ Vantomme, A.² De Wachter, J.³ Degroote, S.⁴ Pattyn, H.⁵ Langouche, G.⁶ Bender, H.⁷

15
- 0013032038
- M. F. Wu, A. Vantomme, H. Pattyn, G. Langouche, Q. Yang, and Q. Wang, J. Appl. Phys. 80, 5713 (1996).
- (1996) J. Appl. Phys. , vol.80 , pp. 5713
- Wu, M.F.¹ Vantomme, A.² Pattyn, H.³ Langouche, G.⁴ Yang, Q.⁵ Wang, Q.⁶

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