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Volumn 36, Issue 25, 1997, Pages 6434-6440

Polarization quadrature measurement of subwavelength diffracting structures

Author keywords

Metrology; Optical disk memories; Scatterometry; Vector diffraction

Indexed keywords

COMPUTER SIMULATION; DIFFRACTION GRATINGS; ELECTRIC FIELDS; ELECTROMAGNETIC FIELD THEORY; INTEGRATION; LIGHT POLARIZATION; LIGHT REFLECTION; OPTICAL DISK STORAGE; OPTICAL VARIABLES MEASUREMENT; OPTICAL WAVEGUIDES; PHOTODETECTORS;

EID: 0031238020     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.36.006434     Document Type: Article
Times cited : (21)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.