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Volumn 38, Issue 34, 1999, Pages 7018-7025

Generalized algorithm for photoelastic measurements based on phase-stepping imaging polarimetry

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001129908     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.38.007018     Document Type: Article
Times cited : (23)

References (15)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.