Sinusoidal wavelength-scanning interferometer with a superluminescent diode for step-profile measurement

Applied Optics

Volumn 39, Issue 25, 2000, Pages 4589-4592

  Sasaki, Osami ^a   Murata, Norihiko ^a   Suzuki, Takamasa ^a  

^a NIIGATA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIODES; INTERFEROMETRY; LIGHT SOURCES; LUMINESCENCE; PHASE MODULATION;

SUPERLUMINESCENT DIODES;

INTERFEROMETERS;

EID: 0000456956     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.39.004589     Document Type: Article

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