Sinusoidal wavelength-scanning interferometers

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3478, Issue , 1998, Pages 37-44

  Sasaki, Osami ^a   Tsuji, Kenichiro ^a   Sato, Shouichi ^a   Kuwahara, Tomokazu ^a   Suzuki, Takamasa ^a  

^a NIIGATA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETERS; INTERFEROMETRY; LASERS; LIGHT; LIGHT SOURCES; LIGHTING; MODULATION; OPTICAL INSTRUMENTS; WAVELENGTH;

CENTRAL WAVELENGTHS; EXTERNAL-; HIGH ACCURACIES; INTERFERENCE SIGNALS; LASER DIODES; MEASURED VALUES; MEASUREMENT ACCURACIES; MODULATION AMPLITUDES; OPTICAL PATH LENGTHS; SCANNING INTERFEROMETERS; TUNABLE LASER DIODES; TWO DIFFERENT METHODS;

SCANNING;

EID: 57849134284     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.312959     Document Type: Conference Paper

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