Optical scanning extrinsic Fabry-Perot interferometer for absolute microdisplacement measurement

Applied Optics

Volumn 36, Issue 34, 1997, Pages 8858-8861

  Li, Tianchu ^a,b   May, Russell G ^a   Wang, Anbo ^a   Claus, Richard O ^a  

^a Virginia Polytechnic Institute and State University   (United States)

^b VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000956659     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.36.008858     Document Type: Article

References (7)

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2. K. A. Murphy, M. F. Gunther, A. M. Vengsarkar, and R. O. Claus, “Quadrature phase-shifted, extrinsic Fabry-Perot optical fiber sensors,” Opt. Lett. 16, 273-275 (1991).
3. T. Li, A. Wang, K. Murphy, and R. Claus, “White-light scanning fiber Michelson interferometer for absolute position-distance measurement,” Opt. Lett. 20, 785-787 (1995).
4. C. Belleville and G. Duplain, “White-light interferometric multimode fiber-optic strain sensor,” Opt. Lett. 18, 78-80 (1993).
5. B. Fogg, A. Wang, M. Miller, K. Murphy, and R. Claus, “Optical fiber sensor for absolute measurement,” in Fiber Optic Sensor-Based Smart Materials and Structures, R. O. Claus, ed. (Institute of Physics, Bristol, England, 1992), pp. 51-54.
6. D. Wang, Y. Ning, A. Palmer, K. Grattan, and K. Weir, “An optical scanning technique in a white light interferometric system,” IEEE Photon. Technol. Lett. 6, 855-857 (1994).
7. G. Ball and W. Morey, “60 mW 1.5 μm single-frequency low-noise fiber laser MOPA,” IEEE Photon. Technol. Lett. 6, 192-194 (1994).