Ultrafast extended x-ray absorption fine structure (EXAFS) - Theoretical considerations

Journal of Chemical Physics

Volumn 111, Issue 14, 1999, Pages 6238-6246

  Brown, Frank L H ^a   Wilson, Kent R ^a   Cao, Jianshu ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000426132     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.479928     Document Type: Article

References (44)

1. H. Fricke, Phys. Rev. 16, 202 (1920).
2. G. Hertz, Z. Phys. 3, 19 (1920).
3. R. Kronig, Z. Phys. 70, 317 (1931); 75, 468 (1932); 76, 468 (1932).
4. R. Kronig, Z. Phys. 70, 317 (1931); 75, 468 (1932); 76, 468 (1932).
5. R. Kronig, Z. Phys. 70, 317 (1931); 75, 468 (1932); 76, 468 (1932).
6. E. A. Stern, in EXAFS Spectroscopy, edited by B. K. Teo and D. C. Joy (Plenum, New York, 1981).
7. P. A. Lee, P. H. Citrin, P. Eisenberger, and M. Kincaid, Rev. Mod. Phys. 53, 769 (1981).
8. U. Buontempo, A. Di Cicco, A. Filipponi, M. Nardone, and P. Postorino, J. Chem. Phys. 107, 5720 (1997).
9. Proceedings of the Tenth International Conference on X-ray Absortion Fine Structure XAPS X, J. Synchrotron Radiation 6, 121 (1999).
10. A. Rogalev and J. Goulon, J. Phys. IV 7, C2-565 (1997).
11. M. R. Chance, M. D. Wirt, E. M. Scheuring, L. M. Miller, A. Xie, and D. E. Sidelinger, Rev. Sci. Instrum. 64, 2035 (1993).
12. D. M. Mills, A. Lewis, A. Harootunian, J. Huang, and B. Smith, Science 223, 811 (1984).
13. Y. Inada, H. Hayashi, and S. Funahashi, Rev. Sci. Instrum. 68, 2973 (1997).
14. L. X. Chen, M. R. Wasielewski, T. Rajh, P. L. Lee, M. C. Thurnauer, and P. A. Montano, J. Phys. IV 7, C2-569 (1997).
15. T. Anderson, I. V. Tomov, and P. M. Rentzepis, J. Chem. Phys. 99, 869 (1993).
16. M. M. Murnane, H. C. Kapteyn, M. D. Rosen, and R. W. Falcone, Science 251, 531 (1991).
17. R. W. Schoenlein, W. P. Leemans, A. H. Chin, P. Volfbeyn, T. E. Glover, P. Balling, M. Zolotorev, K.-J. Kim, S. Chattopadhyay, and C. V. Shank, Science 274, 236 (1996).
18. J. Larsson, P. A. Heimann, A. M. Lindenberg, P. J. Schuck, P. H. Bucksbaum, R. W. Lee, H. A. Padmore, J. S. Wark, and R. W. Falcone, Appl. Phys. A: Mater. Sci. Process. 66, 587 (1998).
19. T. Guo, C. Rose-Petruck, R. Jimenez, F. Raksi, J. A. Squier, B. C. Walker, K. R. Wilson, and C. P. J. Barty, Proc. SPIE 3157, 84 (1997).
20. W. P. Leemans, R. W. Schoenlein, P. Volfbeyn, A. H. Chin, T. E. Glover, P. Balling, M. Zolotorev, K. J. Kim, S. Chattopadhyay, and C. V. Shank, Phys. Rev. Lett. 77, 4182 (1996).
21. C. Rischel, A. Rousse, I. Uschmann, P.-A. Albouy, J.-P. Geindre, P. Audebert, J.-C. Gauthier, E. Forster, J.-L. Martin, and A. Antonetti, Nature (London) 390, 490 (1997).
22. C. Rose-Petruck, R. Jimenez, T. Guo, A. Cavalleri, C. W. Siders, F. Raksi, J. A. Squier, B. C. Walker, K. R. Wilson, and C. P. J. Barty, Nature (London) 398, 310 (1999).
23. F. Raksi, K. R. Wilson, Z. Jiang, A. Ikhlef, C. Y. Cote, and J.-C. Kieffer, J. Chem. Phys. 104, 6066 (1996).
24. Time Resolved Diffraction, edited by J. R. Helliwell and P. M. Rentzepis (Clarendon, Oxford, 1997).
25. V. Srajer, T. Teng, T. Ursby, C. Pradervand, Z. Ren, S. Adachi, W. Schildkamp, D. Bourgeois, M. Wulff and K. Moffat, Science 274, 1726 (1996).
26. J. P. Bergsma, M. H. Coladonato, P. M. Edelsten, K. R. Wilson, and D. R. Fredkin, J. Chem. Phys. 84, 6151 (1986).
27. M. Ben-Nunn, J. Cao, and K. R. Wilson, J. Phys. Chem. 101, 8743 (1997).
28. J. Cao and K. R. Wilson, J. Phys. Chem. 102, 9523 (1998).
29. S. H. Lin, C. H. Chao, H. Ma and P. M. Rentzepis, in Time-Resolved Electron and X-ray Diffraction, Proceedings of SPIE-Int. Soc. Opt. Eng. 2521, 258 (1995), edited by P. M. Rentzepis.
30. See EPAPS Document No. E-JCPSA6-111-003938 for a PDF format appendix of this work. This document may be retrieved via the EPAPS homepage (http://www.aip.org/pubservs/epaps.html) or from ftp.aip.org in the directory /epaps/. See the EPAPS homepage for more information.
31. J. Cao, C. J. Bardeen, and K. R. Wilson, Phys. Rev. Lett. 80, 1406 (1998).
32. S. I. Zabinsky, J. J. Rehr, A. Ankudinov, R. C. Albers, and M. J. Eller, Phys. Rev. B 52, 2995 (1995); J. Mustre de Leon, J. J. Rehr, S. I. Zabinsky, and R. C. Albers, ibid. 44, 4146 (1991); J. J. Rehr, J. Mustre de Leon, S. I. Zabinsky, and R. C. Albers, J. Am. Chem. Soc. 113, 5135 (1991).
33. S. I. Zabinsky, J. J. Rehr, A. Ankudinov, R. C. Albers, and M. J. Eller, Phys. Rev. B 52, 2995 (1995); J. Mustre de Leon, J. J. Rehr, S. I. Zabinsky, and R. C. Albers, ibid. 44, 4146 (1991); J. J. Rehr, J. Mustre de Leon, S. I. Zabinsky, and R. C. Albers, J. Am. Chem. Soc. 113, 5135 (1991).
34. S. I. Zabinsky, J. J. Rehr, A. Ankudinov, R. C. Albers, and M. J. Eller, Phys. Rev. B 52, 2995 (1995); J. Mustre de Leon, J. J. Rehr, S. I. Zabinsky, and R. C. Albers, ibid. 44, 4146 (1991); J. J. Rehr, J. Mustre de Leon, S. I. Zabinsky, and R. C. Albers, J. Am. Chem. Soc. 113, 5135 (1991).
35. A. Filipponi, A. Di Cicco, and C. R. Natoli, Phys. Rev. B 52, 15122 (1995).
36. J. Cao, C. J. Bardeen, and K. R. Wilson, J. Chem. Phys. (submitted).
37. L. Allen and J. Eberly, Optical Resonance and Two-Level Atoms (Dover, New York, 1987).
38. C. J. Bardeen, J. Che, K. R. Wilson, V. V. Yakovlev, V. A. Apkarian, C. C. Martens, R. Zadoyan, B. Kohler, and M. Messina, J. Chem. Phys. 106, 8486 (1997).
39. G. Baym, Lectures on Quantum Mechanics (Addison-Wesley, New York, 1990).
40. Our calculations were performed using FEFF 7.02 with the RGRID option set equal to 0.02. The standard setting of 0.05 was found to be too large to insure convergence for the inflated (relative to equilibrium) bond lengths found in our simulations.
41. J. J. Boland, S. E. Crane, and J. D. Baldeschwieler, J. Chem. Phys. 77, 142 (1982).
42. E. A. Stern, Contemp. Phys. 18, 289 (1978).
43. L. V. Azaroff, Rev. Mod. Phys. 35, 1012 (1963).
44. j(k) is purely conventional.