Ultrafast structural changes measured by time-resolved X-ray diffraction

Applied Physics A: Materials Science and Processing

Volumn 66, Issue 6, 1998, Pages 587-591

  Larsson, J ^a   Heimann, P A ^b   Lindenberg, A M ^a   Schuck, P J ^a   Bucksbaum, P H ^c   Lee, R W ^d   Padmore, H A ^b   Wark, J S ^e   Falcone, R W ^a,b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF MICHIGAN   (United States)

^d LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^e UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; LASER PULSES; PHASE TRANSITIONS; SEMICONDUCTING INDIUM COMPOUNDS; X RAY DIFFRACTION;

ULTRAFAST DISORDERING; ULTRASHORT LASER PULSE;

ULTRAFAST PHENOMENA;

EID: 0032095417     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390050719     Document Type: Article

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