X-Ray based subpicosecond electron bunch characterization using 90° thomson scattering

Physical Review Letters

Volumn 77, Issue 20, 1996, Pages 4182-4185

  Leemans, W P ^a   Schoenlein, R W ^a   Volfbeyn, P ^a   Chin, A H ^a   Glover, T E ^a   Balling, P ^a   Zolotorev, M ^a   Kim, K J ^a   Chattopadhyay, S ^a   Shank, C V ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM FOIL; CALCULATIONS; CHARGE COUPLED DEVICES; CRYSTAL LATTICES; DENSITY MEASUREMENT (OPTICAL); ELECTRON SCATTERING; LASER PULSES; LINEAR ACCELERATORS; PHASE LOCKED LOOPS; PHOSPHORS; X RAYS;

ELECTRON BUNCHES; INTERACTION POINT; MAGNETIC LATTICE; OPTICAL TRANSITION RADIATION; THOMSON SCATTERING;

ELECTRON BEAMS;

EID: 0030290478     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.77.4182     Document Type: Article

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