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Applied Physics Letters

Volumn 77, Issue 17, 2000, Pages 2695-2697

Electron beam and optical depth profiling of quasibulk GaN

(9) Chernyak, L a Osinsky, A b Nootz, G a Schulte, A a Jasinski, J c,f Benamara, M c Liliental Weber, Z c Look, D C d Molnar, R J e

a UNIVERSITY OF CENTRAL FLORIDA (United States)

b Corning Applied Technologies ^* (United States)

c LAWRENCE BERKELEY NATIONAL LABORATORY (United States)

d WRIGHT STATE UNIVERSITY (United States)

e MIT LINCOLN LABORATORY (United States)

f UNIVERSITY OF WARSAW (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000359120 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1319530 Document Type: Article

Times cited : (64)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.