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Volumn 58, Issue 13, 1998, Pages 8566-8573

Exchange anisotropy in epitaxial and polycrystalline NiO/NiFe bilayers

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Indexed keywords


EID: 0000299977     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.58.8566     Document Type: Article
Times cited : (58)

References (45)
  • 2
    • 0003568792 scopus 로고
    • A. Yelon, in Physics of Thin Films, edited by H. Francombe and R. W. Hoffman (Academic Press, New York, 1971).
    • (1971) Physics of Thin Films
    • Yelon, A.1
  • 20
    • 36149016904 scopus 로고
    • W. L. Roth, Phys. Rev. 110, 1333 (1958).
    • (1958) Phys. Rev. , vol.110 , pp. 1333
    • Roth, W.1
  • 21
    • 0000816470 scopus 로고
    • W. L. Roth, Phys. Rev. 111, 772 (1958).
    • (1958) Phys. Rev. , vol.111 , pp. 772
    • Roth, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.