Exchange biasing in MBE grown Fe3O4/CoO bilayers: The antiferromagnetic layer thickness dependence

Journal of Applied Physics

Volumn 79, Issue 8 PART 2A, 1996, Pages 5103-5105

  Van Der Zaag, P J ^a   Ball, A R ^a   Feiner, L F ^a   Wolf, R M ^a   Van Der Heijden, P A A ^b  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

^b EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000594508     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.361315     Document Type: Article

References (21)

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