Effect of stress on exchange coupling field, coercivity, and uniaxial anisotropy field of NiFe/NiO bilayer thin films

Applied Physics Letters

Volumn 70, Issue 5, 1997, Pages 664-666

  Han, De Hua ^a   Zhu, Jian Gang ^a   Judy, Jack H ^a   Sivertsen, John M ^a,b  

^a UNIVERSITY OF MINNESOTA   (United States)

^b Dept of Chem Eng and Mat Science ^*

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0006372861     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118327     Document Type: Article

References (8)

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