Calculations of Exchange Bias in Thin Films with Ferromagnetic/Antiferromagnetic Interfaces

Physical Review Letters

Volumn 78, Issue 25, 1997, Pages 4865-4868

  Koon, N C ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042417841     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.78.4865     Document Type: Article

References (13)

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